Enhancement of liner materials based on nanomaterials to promote sustainability in noise intercourse

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Keywords:

3D-IC integration, Aggressive TSV, Future IC integration, Noise intercourse, TSV

Abstract

Daily  usage  of  devices  has  had  a  major  influence  on  lives  and  existence, which  would  be  unimaginable  without  them.  Due  to  this,  recent  gadget dependability  concerns  need particular  attention. PCs,  hand  mobile  phones, and  other computerized  household  gadgets  need  integrated  circuits(ICs). Individual  components  must  work  together  to  accomplish  their  tasks  and make  the  circuit  operate.  Hot  carrier  effect,  oxide  breakdown,  and  other system-level  problems  result  from  accommodating  several  devices  in  a planar  IC.  Vertical  linking  active  components  in  one  IC  to  another  IC  is  a common  method  of  three-dimensional  IC  integration  (3D-IC).  The  main issue  with 3D-IC adoption  is  electrical  interference  to  neighboring  through silicon via(TSV)and active transistors, which substantially reduces system performance.  The electrical TSV(ETSV)model,  which  employs  solely electrical  signal  carrying  TSV,  and  the thermal TSV  (TTSV)model,  which incorporates thermal  TSV  during  simulation,  are  used  in  this  research  to reduce  electrical  interference.  The  electrical  signal  transporting  TSV  to  the substrate  and  other  TSV  was  investigated  for  interference.  With  other models,  this  study  also  shows  higher  frequency  regimes  up  to  1  THz. We found that the suggested methodology improves 3D-IC development by more than 30% by reducing electrical interference from signal-carrying TSV to other TSV.

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Published

2026-02-12

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Articles